Memory Integrated Circuits Reports

Hyper-V® 2012 vs. vSphere™ 5.1 - Understanding the Differences
sponsored by SolarWinds, Inc.
WHITE PAPER: In order to help vSphere administrators make the knowledge leap between VMware vSphere and Microsoft Hyper-V, this paper will outline the differences between the currently shipping products from both VMware and Microsoft: vSphere 5.1 and Hyper-V 2012. Discover key features in the products and be exposed to the feature details as that may exist.
Posted: 26 Aug 2013 | Published: 26 Aug 2013

SolarWinds, Inc.

Simple steps for perfecting your NVMe deployment
sponsored by Western Digital
EGUIDE: Knowing what questions to ask and how to avoid common deployment errors when implementing NVMe technology will save you time and money. Save yourself from a great deal of frustration with this E-Guide, which covers the mistakes you'll need to avoid and the questions you'll need to ask when deploying NVMe.
Posted: 16 May 2019 | Published: 16 May 2019

TOPICS:  Memory
All resources sponsored by Western Digital

Red Hat Enterprise Linux 6 on Next-Generation Servers
sponsored by Dell, Inc., Intel and Red Hat
WHITE PAPER: This white paper examines the defining reliability, availability, and serviceability characteristics of Red Hat Enterprise Linux. Learn how they enable the addition and removal of physical and logical devices while improving system availability and increasing capacity.
Posted: 27 Apr 2011 | Published: 26 Apr 2011

Dell, Inc., Intel and Red Hat

Best Practices for a Data Warehouse on Oracle Database 11g
sponsored by Oracle Corporation
WHITE PAPER: In order to ensure the enterprise data warehouse will get the optimal performance and will scale as your data set grows you need to get three fundamental things correct, the hardware configuration, the data model and the data loading process.
Posted: 19 Jan 2009 | Published: 19 Jan 2009

Oracle Corporation

Dell™Reliable Memory Technology
sponsored by DellEMC and Intel®
WHITE PAPER: This paper examines the root causes of memory errors and discusses and discusses the core concepts of technology designed to remediate and obviate these errors.
Posted: 12 Mar 2014 | Published: 12 Mar 2014

DellEMC and Intel®

Getting Started with LINQ to XML
sponsored by Global Knowledge
WHITE PAPER: LINQ is an acronym which stands for Language Integrated Query. This new technology comes built into the .NET Framework 3.5 and can be used with any of the different languages that run under .NET. This paper serves as an introduction.
Posted: 10 Dec 2008 | Published: 10 Dec 2008

Global Knowledge

E-Book: Virtualizing Your Infrastructure Chapter 2: Virtualization Management Strategies and Guidelines
sponsored by TechTarget Data Center
EBOOK: Get an analysis of challenges that accompany server virtualization, and strategies to address them.
Posted: 07 Mar 2013 | Published: 31 Dec 2012

TechTarget Data Center

Canadian Airport Reaps the Benefits of Truly Unified Communications
sponsored by Hewlett Packard Enterprise
CASE STUDY: In this case study learn how Halifax International Airport Authority, one of Canada's largest airports, developed and integrated a unified communications solution that created flexibility and efficiency for how their terminal space is utili...
Posted: 06 Jun 2008 | Published: 01 Feb 2008

Hewlett Packard Enterprise

E-Guide: SQL Server virtualization, hardware tips and trends
sponsored by DELL TECHNOLOGIES AND MICROSOFT
EGUIDE: When it comes to SQL Server virtualization, there are a few pitfalls lurking among the undeniable benefits, including hardware considerations specific to a virtualized SQL environment. Read this e-guide to learn expert tips for ensuring a successful SQL Server virtualization initiative.
Posted: 09 Feb 2012 | Published: 30 Jan 2012

DELL TECHNOLOGIES AND MICROSOFT

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments